Hadi Amiri
Publications
CURE:Circuit-Aware Unlearning for LLM-based Recommendation
Recent advances in large language models (LLMs) have opened new opportunities for recommender systems by enabling rich semantic understanding and reasoning about user interests and item attributes. However, as privacy regulations tighten, incorporating user data into LLM-based recommendation (LLMRec) introduces significant privacy risks, making unlearning algorithms increasingly crucial for practical deployment. Despite growing interest in LLMRec unlearning, most existing approaches formulate unlearning as a weighted combination of forgetting and retaining objectives while updating model parameters in a uniform manner. Such formulations inevitably induce gradient conflicts between the two objectives, leading to unstable optimization and resulting in either ineffective unlearning or severe degradation of model utility. Moreover, the unlearning procedure remains largely black-box, undermining its transparency and trustworthiness. To tackle these challenges, we propose CURE, a circuit-aware unlearning framework that disentangles model components into functionally distinct subsets and selectively updates them. Here, a circuit refers to a computational subgraph that is causally responsible for task-specific behaviors. Specifically, we extract the core circuits underlying item recommendation and analyze how individual modules within these circuits contribute to the forget and retain objectives. Based on this analysis, these modules are categorized into forget-specific, retain-specific, and task-shared groups, each subject to function-specific update rules to mitigate gradient conflicts during unlearning. Experiments on real-world datasets show that our approach achieves more effective unlearning than existing baselines.
Toward Understanding Unlearning Difficulty: A Mechanistic Perspective and Circuit-Guided Difficulty Metric
Machine unlearning is becoming essential for building trustworthy and compliant language models. Yet unlearning success varies considerably across individual samples: some are reliably erased, while others persist despite the same procedure. We argue that this disparity is not only a data-side phenomenon, but also reflects model-internal mechanisms that encode and protect memorized information. We study this problem from a mechanistic perspective based on model circuits--structured interaction pathways that govern how predictions are formed. We propose Circuit-guided Unlearning Difficulty (CUD), a {\em pre-unlearning} metric that assigns each sample a continuous difficulty score using circuit-level signals. Extensive experiments demonstrate that CUD reliably separates intrinsically easy and hard samples, and remains stable across unlearning methods. We identify key circuit-level patterns that reveal a mechanistic signature of difficulty: easy-to-unlearn samples are associated with shorter, shallower interactions concentrated in earlier-to-intermediate parts of the original model, whereas hard samples rely on longer and deeper pathways closer to late-stage computation. Compared to existing qualitative studies, CUD takes a first step toward a principled, fine-grained, and interpretable analysis of unlearning difficulty; and motivates the development of unlearning methods grounded in model mechanisms.
Investigating Tool-Memory Conflicts in Tool-Augmented LLMs
Tool-augmented large language models (LLMs) have powered many applications. However, they are likely to suffer from knowledge conflict. In this paper, we propose a new type of knowledge conflict -- Tool-Memory Conflict (TMC), where the internal parametric knowledge contradicts with the external tool knowledge for tool-augmented LLMs. We find that existing LLMs, though powerful, suffer from TMC, especially on STEM-related tasks. We also uncover that under different conditions, tool knowledge and parametric knowledge may be prioritized differently. We then evaluate existing conflict resolving techniques, including prompting-based and RAG-based methods. Results show that none of these approaches can effectively resolve tool-memory conflicts.